AFM and STM: Tip-Surface Interaction
The two workhorses of nanoscale imaging. A sharp tip scans an atomically corrugated surface. In atomic force microscopy the tip feels the Lennard-Jones interaction : strongly repulsive when it touches, weakly attractive further out, zero force at . In scanning tunnelling microscopy the tip draws a current that decays exponentially with the gap, with ; for a metallic work function ( eV) that is roughly a factor of ten in current per angstrom of gap, which is why STM resolves single atoms. Pick AFM (force curve and scan), STM constant-height (atomic-contrast current map) or STM constant-current (the topograph that reproduces the surface). The tip sweeps across the lattice and the bottom panel traces the signal. Everything is closed form (gate-tested).
WHAT TO TRY
- In the default constant-height mode, drag the gap: the whole current map brightens as the tip drops and goes dark as it lifts, because I falls off exponentially with the gap.
- Raise the work function phi: kappa grows, the per-angstrom current factor climbs toward ten, and the atomic spots sharpen. This is why STM resolves single atoms.
- Switch to constant-current to see the topograph that faithfully reproduces the surface, or to AFM to read the Lennard-Jones force curve with the operating point marked.